Aberration-corrected scanning transmission electron microscopy of semiconductors
نویسندگان
چکیده
منابع مشابه
Aberration-corrected scanning transmission electron microscopy of semiconductors
The scanning transmission electron microscope (STEM) has been able to image individual heavy atoms in a light matrix for some time. It is now able to do much more: it can resolve individual atoms as light as boron in monolayer materials; image atomic columns as light as hydrogen, identify the chemical type of individual isolated atoms from the intensity of their annular dark field (ADF) image a...
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ژورنال
عنوان ژورنال: Journal of Physics: Conference Series
سال: 2011
ISSN: 1742-6596
DOI: 10.1088/1742-6596/326/1/012005